EPR 13C Acoustic propreties of solid Topological defects Magnetic anisotropy 15N 17Op 6855Jk Adsorption Charge exchange Silicon Carbide Zinc oxide Hysteresis XRD NRP Isotopic Tracing Auger electron spectroscopy AES Ion implantation Ferromagnetic resonance Measurement Oxygen deficiency PIXE Aluminum X-ray diffraction ALD Nickel Atomic Layer Deposition ALD Periodic multilayer Aluminium 17Opp 8140Ef 18O Photoluminescence SiC Kossel diffraction Stable isotopic tracing AFM 3C-SiC Channeling Rutherford backscattering spectrometry RBS Adsorption Isotherms Epitaxial growth 17O Interface defects 2H Alloys Ion beam analysis Ageing AC susceptibility Oxidation Growth Indium oxide Multilayer Defects 7550Pp NRA Low energy electron diffraction LEED Magnetization curves Acoustic Gallium oxide 7550Ee Topological insulators Metal-insulator transition Adsorbed layers 18O resonance Al2O3 RBS Pb centers Thin film Nuclear reaction analysis GaMnAs Capillary condensation Epitaxy HfO2 Energy loss 27Alda Annealing Silicon 27Aldp Pulsed laser deposition 27Ald p&α Thin films Diffusion Transparent conductive oxide TCO ADSORPTION DESORPTION HYSTERESIS Density functional theory Nanostructures Silicon carbide Nanoparticles Silica Evaluation Passivation Raman spectroscopy 7630Lh Nitridation XPS Nuclear resonance profiling NRP Magnetic semiconductors Gold Sputtering